Ability evaluation by binary tests: Problems, challenges & recent advances.
| Autor: | E Bashkansky, V Turetsky |
|---|---|
| Zdroj: | Journal of Physics: Conference Series; 2016, Vol. 772 Issue 1, p1-1, 1p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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| Autor: | E Bashkansky, V Turetsky |
|---|---|
| Zdroj: | Journal of Physics: Conference Series; 2016, Vol. 772 Issue 1, p1-1, 1p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|