Performance and reliability analysis for VLSI circuits using 45nm technology.
| Autor: | Rahul, Yadav, Ajeet Kumar, Ayubi, Herman Al, Rizvi, Navaid Z |
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| Zdroj: | 2016 International Conference on Electrical, Electronics & Optimization Techniques (ICEEOT); 2016, p4612-4616, 5p |
| Databáze: | Complementary Index |
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