Development of At-speed Interconnect Test to Capture Marginal Open Defect on FPGA.
| Autor: | bin Mohamed Sultan, Fahmy Hafriz, binti Dahari, Zuraini, Koh, Yien Yien, Da Cunha, Neil, Ng, Jia Tian |
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| Zdroj: | 9th International Conference on Robotic, Vision, Signal Processing & Power Applications; 2017, p27-35, 9p |
| Databáze: | Complementary Index |
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