| Autor: |
Babkina, I., Gabriel's, K., Epryntseva, T., Zhilova, O., Makagonov, V., Sitnikov, A., Hlopovskikh, P. |
| Zdroj: |
Bulletin of the Russian Academy of Sciences: Physics; Sep2016, Vol. 80 Issue 9, p1168-1171, 4p |
| Abstrakt: |
The effect heat treatment has on the electrotransport mechanisms in films of ZnO and InO, and in a multilayer (InO/ZnO) structure obtained via ion-beam sputtering, is studied. It is shown that there is a mechanism of weak electron localization in the InO and (InO/ZnO) samples. The relaxation processes that occur during the heat treatment of InO films are found to increase the length of elastic electron scattering, but to reduce this parameter in multilayer heterostructures. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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