| Autor: |
McVitie, S., White, G. S. |
| Předmět: |
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| Zdroj: |
Journal of Physics D: Applied Physics; Jan2004, Vol. 37 Issue 2, p280-288, 9p |
| Abstrakt: |
The magnetic structure of thin films may be imaged in a transmission electron microscope by the techniques of Lorentz microscopy. In this paper, we re-interpret the underlying principles behind this imaging mode to show that it may be considered, in appropriate circumstances, as Amperian current microscopy. One of the benefits of this interpretation is that results from micromagnetic simulations may now be more easily formulated into the corresponding images expected from Lorentz microscopy. Examples are given in this paper which demonstrate the utility of this approach and also provide excellent agreement by direct comparison between experimental and simulated images of magnetic thin film structures. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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