Measurement-based MOSFET model for helium temperatures.
Autor: | Biryukov, Vadim N., Pilipenko, Alexandr M. |
---|---|
Zdroj: | 2015 IEEE East-West Design & Test Symposium (EWDTS); 2015, p1-4, 4p |
Databáze: | Complementary Index |
Externí odkaz: |
Autor: | Biryukov, Vadim N., Pilipenko, Alexandr M. |
---|---|
Zdroj: | 2015 IEEE East-West Design & Test Symposium (EWDTS); 2015, p1-4, 4p |
Databáze: | Complementary Index |
Externí odkaz: |