Thermal raman and IR measurement of heterogeneous integration stacks.
| Autor: | Harris, T. Robert, Pavlidis, Georges, Wyers, Eric J., Marshal Newberry, D., Graham, Samuel, Franzon, Paul, Davis, W. Rhett |
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| Zdroj: | 2016 15th IEEE Intersociety Conference on Thermal & Thermomechanical Phenomena in Electronic Systems (ITherm); 2016, p1505-1510, 6p |
| Databáze: | Complementary Index |
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