AMHS design for reticles in photolithography area of an existing wafer fab: IE: Industrial engineering.

Autor: Ben-Salem, Ali, Yugma, Claude, Troncet, Emmanuel, Pinaton, Jacques
Zdroj: 2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC); 2016, p110-115, 6p
Databáze: Complementary Index