NLTF based BIST circuit for DRAM testing.
| Autor: | Sfikas, Yiorgos, Tsiatouhas, Yiorgos |
|---|---|
| Zdroj: | 2016 5th International Conference on Modern Circuits & Systems Technologies (MOCAST); 2016, p1-4, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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| Autor: | Sfikas, Yiorgos, Tsiatouhas, Yiorgos |
|---|---|
| Zdroj: | 2016 5th International Conference on Modern Circuits & Systems Technologies (MOCAST); 2016, p1-4, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|