Virtual metrology on Chemical Mechanical Planarization process based on Just-In-Time Learning.

Autor: Jebri, M.A., Graton, G., El Adel, E.M., Ouladsine, M., Pinaton, J.
Zdroj: 2016 5th International Conference on Systems & Control (ICSC); 2016, p169-174, 6p
Databáze: Complementary Index