Successive approximation time-to-digital converter with vernier-level resolution.

Autor: Jiang, Richen, Li, Congbing, Yang, Mingcong, Kobayashi, Haruo, Ozawa, Yuki, Tsukiji, Nobukazu, Hirano, Mayu, Shiota, Ryoji, Hatayama, Kazumi
Zdroj: 2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW); 2016, p1-6, 6p
Databáze: Complementary Index