A new criterion for stability assessment of the microwave pHEMT-based low-noise amplifiers.

Autor: Dobes, Josef, Vejrazka, Frantisek, Popp, Jakub, Michal, Jan
Zdroj: 2016 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK); 2016, p1-2, 2p
Databáze: Complementary Index