Characteristic reliability of a hybrid-type temperature sensor using poly-Si thin-film transistors.
| Autor: | Hori, Toshimasa, Taya, Jun, Hayashi, Hisashi, Matsuda, Tokiyoshi, Kimura, Mutsumi |
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| Zdroj: | 2016 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK); 2016, p1-2, 2p |
| Databáze: | Complementary Index |
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