Compact submicrosecond, high current generator for wire explosion experiments.

Autor: Aranchuk, L.E., Chuvatin, A.S., Larour, J.
Předmět:
Zdroj: Review of Scientific Instruments; Jan2004, Vol. 75 Issue 1, p69-74, 6p
Abstrakt: The PIAF generator was designed for low total energy and high energy density experiments with liners, X-pinch or fiber Z-pinch loads. These studies are of interest for such applications as surface and material science, microscopy of biological specimens, lithography of x-ray sensitive resists, and x-ray backlighting of pulsed-power plasmas. The generator is based on an RLC circuit that includes six NWL 180 nF–50 kV capacitors that store up to 1.3 kJ. The capacitors are connected in parallel to a single multispark switch designed to operate at atmospheric pressure. The switch allows reaching a time delay between the trigger pulse and the current pulse of less than 80 ns and has jitter of 6 ns. The total inductance without a load compartment was optimized to be as low as 16 nH, which leads to extremely low impedance of ∼0.12 Ω. A 40 kV initial voltage provides 250 kA maximum current in a 6 nH inductive load with a 180 ns current rise time. PIAF has dimensions of 660×660×490 mm and weight of less than 100 kg, thus manifesting itself as robust, simple to operate, and cost effective. A description of the PIAF generator and the initial experimental results on PIAF with an X-pinch type load are reported. The generator was demonstrated to operate successfully with an X-pinch type load. The experiments first started with investigation of the previously unexplored X-pinch conduction time range, 100 ns–1 μs. A single short radiation pulse was obtained that came from a small, point-like plasma. The following x-ray source characteristics were achieved: typical hot spot size of 50–100 μm, radiation pulse duration of 1.5–2 ns, and radiation yield of about 250–500 mJ in the softer spectral range (hν>=700 eV) and 50–100 mJ in the harder one (hν>=1 keV). These results provide the potential for further application of this source, such as use as a backlight diagnostic tool. © 2004 American Institute of Physics. [ABSTRACT FROM AUTHOR]
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