| Autor: |
Timmermans, F. J., Liszka, B., Lenferink, A. T. M., Wolferen, H. A. G. M., Otto, C. |
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| Zdroj: |
Journal of Raman Spectroscopy; Aug2016, Vol. 47 Issue 8, p956-962, 7p |
| Abstrakt: |
We present an integrated confocal Raman microscope in a focused ion beam scanning electron microscope (FIB SEM). The integrated system enables correlative Raman and electron microscopic analysis combined with focused ion beam sample modification on the same sample location. This provides new opportunities, for example the combination of nanometer resolution with Raman advances the analysis of sub-diffraction-sized particles. Further direct Raman analysis of FIB engineered samples enables in situ investigation of sample changes. The Raman microscope is an add-on module to the electron microscope. The optical objective is brought into the sample chamber, and the laser source, and spectrometer are placed in a module attached onto and outside the chamber. We demonstrate the integrated Raman FIB SEM function with several experiments. First, correlative Raman and electron microscopy is used for the investigation of (sub-)micrometer-sized crystals. Different crystals are identified with Raman, and in combination with SEM the spectral information is combined with structurally visible polymorphs and particle sizes. Analysis of sample changes made with the ion beam is performed on (1) structures milled in a silicon substrate and (2) after milling with the FIB on an organic polymer. Experiments demonstrate the new capabilities of an integrated correlative Raman-FIB-SEM. Copyright © 2016 John Wiley & Sons, Ltd. [ABSTRACT FROM AUTHOR] |
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