| Autor: |
Bertram, F., Gutowski, O., Patommel, J., Schroer, C., Ruett, U. |
| Předmět: |
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| Zdroj: |
AIP Conference Proceedings; 2016, Vol. 1741 Issue 1, p1-4, 4p, 1 Color Photograph, 1 Diagram, 1 Chart, 1 Graph |
| Abstrakt: |
At the high energy X-ray beamline P07 at PETRA III, 1D focusing down to 4 micrometer vertical beam height while preserving a horizontal beam width of 0.5 mm was established by refractive lenses etched into a silicon wafer. A single wafer with 8 different lens structures can cover the full energy range between 50 and 120 keV. For surface diffraction on ultrathin films a factor of 4 in intensity can be achieved compared to the already established Al-compound refractive 2D-lenses. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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