Verification of redox-processes as switching and retention failure mechanisms in Nb:SrTiO3/metal devices.
| Autor: | Baeumer, C., Raab, N., Menke, T., Schmitz, C., Rosezin, R., Müller, P., Andrä, M., Feyer, V., Bruchhaus, R., Gunkel, F., Schneider, C. M., Waser, R., Dittmann, R. |
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| Zdroj: | Nanoscale; 8/7/2016, Vol. 8 Issue 29, p13967-13975, 9p |
| Databáze: | Complementary Index |
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