| Autor: |
Afaah, A. N., Asib, N. A. M., Aadila, A., Mohamed, R., Rusop, M., Khusaimi, Z. |
| Předmět: |
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| Zdroj: |
AIP Conference Proceedings; 2016, Vol. 1733 Issue 1, p1-6, 6p, 1 Black and White Photograph, 2 Diagrams, 1 Chart, 1 Graph |
| Abstrakt: |
p-type ZnO films have been fabricated on ZnO-seeded glass substrate, using AgNO3 as a source of silver dopant by facile solution-immersion. Cleaned glass substrate were seeded with ZnO by mist-atomisation, and next the seeded substrates were immersed in Ag:ZnO solution. The effects of Ag doping concentration on the Ag-doped ZnO have been investigated. The substrates were immersed in different concentrations of Ag dopant with variation of 0, 1, 3, 5 and 7 at. %. The surface morphology of the films was characterized by field emission scanning electron microscope (FESEM). In order to investigate the electrical properties, the films were characterized by Current- Voltage (I-V) measurement. FESEM micrographs showed uniform distribution of nanostructured ZnO and Ag:ZnO. Besides, the electrical properties of Ag-doped ZnO were also dependent on the doping concentration. The I-V measurement result indicated the electrical properties of 1 at. % Ag:ZnO thin film owned highest electrical conductivity. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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