Faults in data prefetchers: Performance degradation and variability.

Autor: Foutris, Nikos, Chatzidimitriou, Athanasios, Gizopoulos, Dimitris, Kalamatianos, John, Sridharan, Vilas
Zdroj: 2016 IEEE 34th VLSI Test Symposium (VTS); 2016, p1-6, 6p
Databáze: Complementary Index