Flexible scan interface architecture for complex SoCs.

Autor: Sonawane, Milind, Chadalavada, Sailendra, Sarangi, Shantanu, Sanghani, Amit, Yilmaz, Mahmut, Kumar Datla Jagannadha, Pavan, Colburn, Jonathon E.
Zdroj: 2016 IEEE 34th VLSI Test Symposium (VTS); 2016, p1-6, 6p
Databáze: Complementary Index