Reduction of diagnostic fail data volume and tester time using a dynamic N-cover algorithm.
| Autor: | Bodhe, Shraddha, Amyeen, M. Enamul, Galendez, Clariza, Mooers, Houston, Pomeranz, Irith, Venkataraman, Srikanth |
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| Zdroj: | 2016 IEEE 34th VLSI Test Symposium (VTS); 2016, p1-6, 6p |
| Databáze: | Complementary Index |
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