High-level modeling and testing of multiple control faults in digital systems.
| Autor: | Jasnetski, Artjom, Oyeniran, Stephen Adeboye, Tsertov, Anton, Scholzel, Mario, Ubar, Raimund |
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| Zdroj: | 2016 IEEE 19th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS); 2016, p1-6, 6p |
| Databáze: | Complementary Index |
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