Hot carrier injection and negative bias temperature instability induced NMOS and PMOS degradation on CMOS Ring Oscillator.
| Autor: | Lahbib, Insaf, Doukkali, Mohamed Aziz, Martin, Patrick, Imbert, Guy |
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| Zdroj: | 2016 Annual Reliability & Maintainability Symposium (RAMS); 2016, p1-7, 7p |
| Databáze: | Complementary Index |
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