Formation of metal interconnects and their resistance-change behavior during tensile stretching for stretchable packaging applications.

Autor: Park, Donghyun, Park, Dae Ung, Han, Kee-Sun, Shin, Soo Jin, Oh, Hyun-Ah, Oh, Tae Sung, Choi, Jung-Yeol, Hynix, S K
Zdroj: 2016 Pan Pacific Microelectronics Symposium (Pan Pacific); 2016, p1-6, 6p
Databáze: Complementary Index