Effect of an inhomogeneous insulating film on the capacitance of metal--insulator--semiconductor...

Autor: Jauhiainen, Anders, Westberg, David
Předmět:
Zdroj: Journal of Applied Physics; 10/1/1998, Vol. 84 Issue 7, p3960, 6p
Abstrakt: Reports on a study which analyzed the impact of an insulating film on the capacitance of metal-insulator-semiconductor (MIS) structures. In-depth look at several MIS devices; Details on the electrical characterization of the MIS devices; Methodology used to conduct the study; Results of the study.
Databáze: Complementary Index