| Autor: |
Kumar, Arun, Singh, Harkawal, Gill, P. S., Goyal, Navdeep |
| Předmět: |
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| Zdroj: |
AIP Conference Proceedings; 2016, Vol. 1728 Issue 1, p020351-1-020351-5, 5p, 1 Diagram, 1 Chart, 2 Graphs |
| Abstrakt: |
The effect of metallic zinc (Zn) on the structural properties of (Se0.8Te0.2)100-xZnx (x = 0, 2, 6, 8, 10) samples analyzed by X-ray Diffraction (XRD). The presence of sharp peaks in XRD patterns confirmed the crystalline nature of the samples and is indexed in orthorhombic crystal structure. XRD studies predicts that the average particle size of all the samples are about 46.29 nm, which is less than 100 nm and hence have strong tendency of agglomeration. Williamson-Hall plot method was used to evaluate the lattice strain. The dislocation density and no. of unit cells of the samples were calculated which show the inverse relation with each other. Morphology index derived from FWHM of XRD data explains the direct relationship with the particle size. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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