Autor: |
Bogle, K. A., Narwade, R. D., Phatangare, A. B., Dahiwale, S. S., Mahabole, M. P., Khairnar, R. S. |
Předmět: |
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Zdroj: |
AIP Conference Proceedings; 2016, Vol. 1728 Issue 1, p020318-1-020318-4, 4p, 3 Graphs |
Abstrakt: |
We are reporting photosensitivity property of BiFeO3 thin film under optical illumination. The thin film used for photosensitivity work was fabricated via sol-gel assisted spin coating technique. I-V measurements on the Cu/BiFeO3/Al structure under dark condition show a good rectifying property and show dramatic blue shit in threshold voltage under optical illumination. The microstructure, morphology and elemental analysis of the films were characterized by using XRD, UV-Vis, FTIR, SEM and EDS. [ABSTRACT FROM AUTHOR] |
Databáze: |
Complementary Index |
Externí odkaz: |
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