The impact of knowing the impedance of the lines used in the TRL calibration on the load-pull characterization of power transistors.
| Autor: | Pulido-Gaytan, M. A, Reynoso-Hernandez, J. A., Maya-Sanchez, M. C., Loo-Yau, J. R. |
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| Zdroj: | 2015 86th ARFTG Microwave Measurement Conference; 2015, p1-5, 5p |
| Databáze: | Complementary Index |
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