A new method for measuring alias-free aperture jitter in an ADC output.
| Autor: | Yamaguchi, Takahiro J., Degawa, Katsuhiko, Kawabata, Masayuki, Ishida, Masahiro, Uekusa, Kouichiro, Soma, Mani |
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| Zdroj: | 2015 IEEE International Test Conference (ITC); 2015, p1-6, 6p |
| Databáze: | Complementary Index |
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