Embedded deterministic test points for compact cell-aware tests.

Autor: Acero, Cesar, Feltham, Derek, Hapke, Friedrich, Moghaddam, Elham, Mukherjee, Nilanjan, Neerkundar, Vidya, Patyra, Marek, Rajski, Janusz, Tyszer, Jerzy, Zawada, Justyna
Zdroj: 2015 IEEE International Test Conference (ITC); 2015, p1-8, 8p
Databáze: Complementary Index