Embedded deterministic test points for compact cell-aware tests.
Autor: | Acero, Cesar, Feltham, Derek, Hapke, Friedrich, Moghaddam, Elham, Mukherjee, Nilanjan, Neerkundar, Vidya, Patyra, Marek, Rajski, Janusz, Tyszer, Jerzy, Zawada, Justyna |
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Zdroj: | 2015 IEEE International Test Conference (ITC); 2015, p1-8, 8p |
Databáze: | Complementary Index |
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