Test-driven modeling of embedded systems.
| Autor: | Munck, Allan, Madsen, Jan |
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| Zdroj: | 2015 Nordic Circuits & Systems Conference (NORCAS): NORCHIP & International Symposium on System-on-Chip (SoC); 2015, p1-4, 4p |
| Databáze: | Complementary Index |
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