Role of IC substrate and ESD protections in noise propagation: Design and modelling of dedicated test chip in 40 nm technology.

Autor: Rotigni, Mario, Merlo, Mauro, Cordoni, Martina, Colombo, Paolo, Liberali, Valentino
Zdroj: 2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo); 2015, p97-102, 6p
Databáze: Complementary Index