Role of IC substrate and ESD protections in noise propagation: Design and modelling of dedicated test chip in 40 nm technology.
Autor: | Rotigni, Mario, Merlo, Mauro, Cordoni, Martina, Colombo, Paolo, Liberali, Valentino |
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Zdroj: | 2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo); 2015, p97-102, 6p |
Databáze: | Complementary Index |
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