A setup for very high temperature measurements of power semiconductors exceeding 500 ?C.
| Autor: | Unger, Christian, Mocanu, Manuela, Ebli, Michael, Pfost, Martin |
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| Zdroj: | 2015 International Semiconductor Conference (CAS); 2015, p149-152, 4p |
| Databáze: | Complementary Index |
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