| Autor: |
TASHLYKOV, I. S., ZUKOWSKI, P., SILVANOVICH, D. A., GREMENOK, V. F. |
| Předmět: |
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| Zdroj: |
Acta Physica Polonica: A; 2015, Vol. 128 Issue 5, p927-930, 4p |
| Abstrakt: |
The paper presents the results of investigation of element composition of CuInSe2 (CIS) compounds obtained by vertical Bridgman technique and on a glass substrate by the thermal deposition of Cu-In thin films with the subsequent annealing in selenium vapour. The depth profile distribution of elements in these samples using the Rutherford backscattering spectrometry/channeling technique in conjunction with the RUMP code simulation is also discussed. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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