| Autor: |
Luis Isaac Ramos Garcia, José Fernando Pérez Azorin, Julio F Almansa |
| Předmět: |
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| Zdroj: |
Physics in Medicine & Biology; 7/1/2016, Vol. 61 Issue 1, p1-1, 1p |
| Abstrakt: |
The purpose of this work is to present a new method to extract the electron density () and the effective atomic number (Zeff) from dual-energy CT images, based on a Karhunen-Loeve expansion (KLE) of the atomic cross section per electron. This method was used to calibrate a Siemens Definition CT using the CIRS phantom. The predicted electron density and effective atomic number using 80 kVp and 140 kVp were compared with a calibration phantom and an independent set of samples. The mean absolute deviations between the theoretical and calculated values for all the samples were 1.7 % ± 0.1 % for and 4.1 % ± 0.3 % for Zeff. Finally, these results were compared with other stoichiometric method. The application of the KLE to represent the atomic cross section per electron is a promising method for calculating and Zeff using dual-energy CT images. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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