Influence of triple-well technology on laser fault injection and laser sensor efficiency.
| Autor: | Borrel, N., Champeix, C., Kussener, E., Rahajandraibe, W., Lisart, M., Sarafianos, A., Dutertre, J-M. |
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| Zdroj: | 2015 IEEE International Symposium on Defect & Fault Tolerance in VLSI & Nanotechnology Systems (DFTS); 2015, p85-90, 6p |
| Databáze: | Complementary Index |
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