A Study of GaN HEMTs Current Collapse Impacts on Doherty Multistage PA Linearity.
| Autor: | Murao, Yoji, Hayakawa, Makoto, Ohgami, Kazuya, Kaneko, Tomoya |
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| Zdroj: | 2015 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS); 2015, p1-4, 4p |
| Databáze: | Complementary Index |
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