Charge transfer speed analysis in pinned photodiode CMOS image sensors based on a pulsed storage-gate method.

Autor: Pelamatti, Alice, Goiffon, Vincent, Chabane, Aziouz, Magnan, Pierre, Virmontois, Cedric, Saint-Pe, Olivier, de Boisanger, Michel Breart
Zdroj: 2015 45th European Solid State Device Research Conference (ESSDERC); 2015, p156-159, 4p
Databáze: Complementary Index