6 Reliability Simulation: 6.4 Experimental Results.

Autor: Tsung-Ching (Jim) Huang, Jiun-Lang Huang, Kwang-Ting (Tim) Cheng
Předmět:
Zdroj: Foundations & Trends in Electronic Design Automation; 2015, Vol. 9 Issue 2, p179-182, 4p
Abstrakt: The article presents experimental data of output waveforms of Simulation Program with Integrated Circuit Emphasis (SPICE) simulation of threshold voltage (VTH) for stressed and unstressed circuit.
Databáze: Complementary Index