6 Reliability Simulation: 6.4 Experimental Results.
Autor: | Tsung-Ching (Jim) Huang, Jiun-Lang Huang, Kwang-Ting (Tim) Cheng |
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Zdroj: | Foundations & Trends in Electronic Design Automation; 2015, Vol. 9 Issue 2, p179-182, 4p |
Abstrakt: | The article presents experimental data of output waveforms of Simulation Program with Integrated Circuit Emphasis (SPICE) simulation of threshold voltage (VTH) for stressed and unstressed circuit. |
Databáze: | Complementary Index |
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