Studying the boundary between the superconducting and stabilizing layers of a taped second-generation high-temperature superconductor.

Autor: Nikolaichik, V., Khodos, I., Klimenko, G., Koval'chuk, M.
Zdroj: Bulletin of the Russian Academy of Sciences: Physics; Nov2015, Vol. 79 Issue 11, p1337-1339, 3p
Abstrakt: The composition and structure of the boundary between superconducting and stabilizing layers in a taped high-temperature superconductor of the second generation are studied by means of scanning and transmission electron microscopy. The superconducting and stabilizing layers are fabricated on the basis of a GdBaCuO oxide layer and metallic silver, respectively. It is shown that nanosized pores 15-30 nm in diameter are located on the boundary from the side of silver layer. The presence of these pores likely determines the magnitude of the interface resistance between the superconducting and stabilizing layers. [ABSTRACT FROM AUTHOR]
Databáze: Complementary Index