Inspecting surface mounted devices using k nearest neighbor and Multilayer Perceptron.
| Autor: | de Mello, Alexandre R., Stemmer, Marcelo R. |
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| Zdroj: | 2015 IEEE 58th International Midwest Symposium on Circuits & Systems (MWSCAS); 2015, p950-955, 6p |
| Databáze: | Complementary Index |
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