Investigation of long-term drift of NTC temperature sensors with less than 1 mK uncertainty.
| Autor: | Kulkarni, Anupama, Patrascu, Mihai, van de Vijver, Yuri, van Wensveen, Jaap, Pijnenburg, Robert, Nihtianov, Stoyan |
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| Zdroj: | 2015 IEEE 58th International Midwest Symposium on Circuits & Systems (MWSCAS); 2015, p150-155, 6p |
| Databáze: | Complementary Index |
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