Numerical evaluation of warpage in PoP encapsulated semiconductors.
| Autor: | Colling, Fabiano A., Moraes, Carlos A. M., Peter, Celso R., Rhod, Eduardo L., Hasenkamp, Willyan, Park, Dong-Hyun, Oh, Tae S. |
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| Zdroj: | 2015 IEEE International Symposium on Intelligent Control (ISIC); 2015, p1-4, 4p |
| Databáze: | Complementary Index |
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