Advanced TCAD simulation of local mismatch in 14nm CMOS technology FinFETs.
| Autor: | Bazizi, E. M., Chakarov, I., Herrmann, T., Zaka, A., Jiang, L., Wu, X., Pandey, S. M., Benistant, F., Reid, D., Brown, A. R., Alexander, C., Millar, C., Asenov, A. |
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| Zdroj: | 2015 12th IEEE International Conference on Advanced Video & Signal Based Surveillance (AVSS); 2015, p341-344, 4p |
| Databáze: | Complementary Index |
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