Impact of gate oxide complex band structure on n-channel III–V FinFETs.
| Autor: | Crum, Dax M., Valsaraj, Amithraj, Register, Leonard F., Banerjee, Sanjay K., Sahu, Bhagawan, Krivakopic, Zoran, Banna, Srinivasa, Nayak, Deepak |
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| Zdroj: | 2015 12th IEEE International Conference on Advanced Video & Signal Based Surveillance (AVSS); 2015, p250-253, 4p |
| Databáze: | Complementary Index |
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