Performance analysis of 22 nm deep submicron NMOS transistors.
| Autor: | Yeap, Kim Ho, Liew, Jor Gie, Loh, Siu Hong, Nisar, Humaira, Rizman, Zairi Ismael |
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| Zdroj: | 2015 6th Asia Symposium on Quality Electronic Design (ASQED); 2015, p123-126, 4p |
| Databáze: | Complementary Index |
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