| Autor: |
Wenwei Yang, F.M., Xinhong Cheng, F.M., Yumei Xing, F.M., Wenjun Li, Yuehui Yu |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 9/15/2003, Vol. 94 Issue 6, p4032, 4p, 3 Diagrams, 3 Graphs |
| Abstrakt: |
Presents a method for calculating the stress current in accelerated test of time dependent dielectric breakdown of stacked dielectrics. Analysis of the interfaces and variations of electron effective masses in different dielectrics by rigorous resolution of the Schrodinger equation in each region; Application of the method for failure mechanism detection and prediction. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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