Early stage of plastic deformation in thin films undergoing electromigration.

Autor: Valek, B.C., Tamura, N., Spolenak, R., Caldwell, W.A., MacDowell, A.A., Celestre, R.S., Padmore, H.A., Bravman, J.C., Batterman, B.W., Nix, W.D., Patel, J.R.
Předmět:
Zdroj: Journal of Applied Physics; 9/15/2003, Vol. 94 Issue 6, p3757, 5p, 2 Black and White Photographs, 1 Diagram, 1 Graph
Abstrakt: Reports on the discovery of an early prefailure mode of plastic deformation involving preferential dislocation generation and motion using synchrotron-based x-ray microdiffraction during an in situ electromigration experiment. Occurrence of the behavior long before macroscopic damage is observed.
Databáze: Complementary Index