Autor: |
Wells, George H., Hunt, Michael R. C., Hopf, Toby, Vassilevski, Konstantin V., Escobedo-Cousin, Enrique, Horsfall, Alton B., Goss, Jonathan P., O'Neill, Anthony |
Předmět: |
|
Zdroj: |
Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics; Sep/Oct2015, Vol. 33 Issue 5, p1-5, 5p |
Abstrakt: |
Metal contamination deposited on few-layer graphene (3 ± 1 monolayers) grown on SiC(0001) was successfully removed from the surface, using low cost adhesive tape. More than 99% of deposited silver contamination was removed from the surface via peeling, causing minimal damage to the graphene. A small change in the adhesion of graphene to the SiC(0001) substrate was indicated by changes observed in pleat defects on the surface; however, atomic resolution images show the graphene lattice remains pristine. Thin layers of contamination deposited via an electron gun during Auger electron spectroscopy/low energy electron diffraction measurements were also found to be removable by this technique. This contamination showed similarities to "roughened" graphene previously reported in the literature. [ABSTRACT FROM AUTHOR] |
Databáze: |
Complementary Index |
Externí odkaz: |
|