Autor:	Katoh, Kentaroh, Kobayashi, Yutaro, Chujo, Takeshi, Wang, Junshan, Li, Ensi, Li, Congbing, Kobayashi, Haruo
Zdroj:	Journal of Electronic Testing; Aug2015, Vol. 31 Issue 4, p419-419, 1p
Abstrakt:	Corrections to the article "A Small Chip Area Stochastic Calibration for TDC Using Ring Oscillator" that was published in the December 23, 2014 issue are presented.
Databáze:	Complementary Index
Externí odkaz:	Zobrazit plný text záznamu Full text from SpringerLink